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Measurement Systemwith Hall and a Four Point Probes for Characterization of Semiconductors Cover

Measurement Systemwith Hall and a Four Point Probes for Characterization of Semiconductors

Open Access
|Apr 2013
DOI: https://doi.org/10.2478/jeec-2012-0015 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632
Language: English
Page range: 106 - 111
Published on: Apr 19, 2013
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year

© 2013 Rudolf Kinder, Miroslav Mikolášek, Daniel Donoval, Jaroslav Kováč, Marek Tlaczala, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons License.