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Cleaning of tungsten tips for subsequent use as cold field emitters or STM probes Cover

Cleaning of tungsten tips for subsequent use as cold field emitters or STM probes

Journal of Electrical Engineering
Volume 75 (2024): Issue 1 (February 2024)
By: Zuzana Košelová,  Lenka Horáková,  Daniel Burda,  Mohammad M. Allaham,  Alexandr Knápek and  Zdenka Fohlerová  
Open Access
|Feb 2024
DOI: https://doi.org/10.2478/jee-2024-0006 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632
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Language: English
Page range: 41 - 46
Submitted on: Dec 5, 2023
Published on: Feb 10, 2024
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year
Keywords:
STM probes,
field emission,
cleaning procedure,
tungsten tip,
FEM
Related subjects:
Engineering,
Introductions and overviews,
Engineering, other

© 2024 Zuzana Košelová, Lenka Horáková, Daniel Burda, Mohammad M. Allaham, Alexandr Knápek, Zdenka Fohlerová, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

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