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Cleaning of tungsten tips for subsequent use as cold field emitters or STM probes Cover

Cleaning of tungsten tips for subsequent use as cold field emitters or STM probes

Open Access
|Feb 2024

Authors

Zuzana Košelová

Zuzana.Koselova@isibrno.cz

Institute of Scientific Instruments of the Czech Academy of Sciences, Brno, Czech Republic
Department of Microelectronics, Brno University of Technology, Brno, Czech Republic

Lenka Horáková

Institute of Materials Science, Brno University of Technology, Brno, Czech Republic

Daniel Burda

Institute of Scientific Instruments of the Czech Academy of Sciences, Brno, Czech Republic
Department of Physics, Brno University of Technology, Brno, Czech Republic

Mohammad M. Allaham

Institute of Scientific Instruments of the Czech Academy of Sciences, Brno, Czech Republic
Department of Physics, Brno University of Technology, Brno, Czech Republic

Alexandr Knápek

Institute of Scientific Instruments of the Czech Academy of Sciences, Brno, Czech Republic

Zdenka Fohlerová

Department of Microelectronics, Brno University of Technology, Brno, Czech Republic
DOI: https://doi.org/10.2478/jee-2024-0006 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632
Language: English
Page range: 41 - 46
Submitted on: Dec 5, 2023
Published on: Feb 10, 2024
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year

© 2024 Zuzana Košelová, Lenka Horáková, Daniel Burda, Mohammad M. Allaham, Alexandr Knápek, Zdenka Fohlerová, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.