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Black silicon – correlation between microstructure and Raman scattering Cover

Black silicon – correlation between microstructure and Raman scattering

Open Access
|Sep 2019
DOI: https://doi.org/10.2478/jee-2019-0042 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632
Language: English
Page range: 58 - 64
Submitted on: Mar 19, 2019
Published on: Sep 28, 2019
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year

© 2019 Stanislav Jurečka, Emil Pinčík, Kentaro Imamura, Taketoshi Matsumoto, Hikaru Kobayashi, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.