Black silicon – correlation between microstructure and Raman scattering
Authors
Stanislav Jurečka
stanislav.jurecka@feit.uniza.sk
Institute of Aurel Stodola, University of Žilina, Liptovský Mikuláš, Slovakia
Emil Pinčík
Institute of Physics SAS, Bratislava, Slovakia
Kentaro Imamura
The Institute of Scientific and Industrial Research, Osaka University, Osaka, Japan
Taketoshi Matsumoto
The Institute of Scientific and Industrial Research, Osaka University, Osaka, Japan
Hikaru Kobayashi
The Institute of Scientific and Industrial Research, Osaka University, Osaka, Japan
Language: English
Page range: 58 - 64
Submitted on: Mar 19, 2019
Published on: Sep 28, 2019
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year
Keywords:
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© 2019 Stanislav Jurečka, Emil Pinčík, Kentaro Imamura, Taketoshi Matsumoto, Hikaru Kobayashi, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.