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A novel temperature controller for in-situ measurement of radiation-induced changes in temperature effects on space electronics Cover

A novel temperature controller for in-situ measurement of radiation-induced changes in temperature effects on space electronics

Journal of Electrical Engineering
Volume 70 (2019): Issue 3 (June 2019)
By: Jiri Haze and  Jiri Hofman  
Open Access
|Jul 2019

References

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DOI: https://doi.org/10.2478/jee-2019-0031 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632
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Language: English
Page range: 227 - 235
Submitted on: Mar 2, 2019
|
Published on: Jul 18, 2019
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year
Keywords:
automated test equipment,
thermoelectric cooler,
thermometers,
test software,
test methods,
temperature effects,
RADFET,
TID,
PMOS,
temperature coefficients,
MTC
Related subjects:
Engineering,
Introductions and overviews,
Engineering, other

© 2019 Jiri Haze, Jiri Hofman, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

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