A novel temperature controller for in-situ measurement of radiation-induced changes in temperature effects on space electronics

Jiri Haze; Jiri Hofman

doi:10.2478/jee-2019-0031

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A novel temperature controller for in-situ measurement of radiation-induced changes in temperature effects on space electronics

Journal of Electrical Engineering

Volume 70 (2019): Issue 3 (June 2019)

By: Jiri Haze and Jiri Hofman

Open Access

|Jul 2019

Abstract

The paper discusses a novel temperature controller and a related test method allowing in-situ measurement of total ionising dose-induced changes in the impact of temperature on electronic devices for space applications. Various results of pilot radiation experiments (testing commercial PMOS transistors, RADFETs, and voltage references) are also presented.

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Articles in this issue

DOI: https://doi.org/10.2478/jee-2019-0031 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632

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Language: English

Page range: 227 - 235

Submitted on: Mar 2, 2019

Published on: Jul 18, 2019

Published by: Slovak University of Technology in Bratislava

In partnership with: Paradigm Publishing Services

Publication frequency: 6 issues per year

Keywords:

automated test equipment,

thermoelectric cooler,

RADFET,

TID,

PMOS,

temperature coefficients,

MTC

Related subjects:

Engineering,

Introductions and overviews,

Engineering, other

© 2019 Jiri Haze, Jiri Hofman, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

Volume 70 (2019): Issue 3 (June 2019)