Have a personal or library account? Click to login
Low–Frequency Noise Measurements Used For Quality Assessment Of GaSb Based Laser Diodes Prepared By Molecular Beam Epitaxy Cover

Low–Frequency Noise Measurements Used For Quality Assessment Of GaSb Based Laser Diodes Prepared By Molecular Beam Epitaxy

Journal of Electrical Engineering
Volume 66 (2015): Issue 4 (July 2015)
By: Zdeněk Chobola,  Miroslav Luňák,  Jiří Vaněk,  Eduard Hulicius and  Ivo Kusák  
Open Access
|Sep 2015

References

  1. [1] VAN DER ZIEL, A.—TONG, H. : Low Frequency Noise Predicts when a Transistor will Fail, Electronics 39 No. 24 (1966), 95–97.
    Search in Google Scholar
  2. [2] GUPTA, M. S. : Applications of Electrical Noise, Proceedings of IEEE 63 No. 7 (July 1975), 996–1010.10.1109/PROC.1975.9877
    Search in Google Scholar
  3. [3] DAI, Y. : Optimal Low-Frequency Noise Criteria used as a Reliability Test for BJTs and Experimental Results, Microelectronics Reliability 31 No. 1 (1991), 75–78.10.1016/0026-2714(91)90350-G
    Search in Google Scholar
  4. [4] CLAEYS, C.—SIMOEN, E. : Noise as Diagnostic Tool for Semiconductor Material and Device Characterization, Journal of the Electrochemical Society 145, No. 6 (June 1998), 2058–2067.10.1149/1.1838597
    Search in Google Scholar
  5. [5] SIKULA, J.—VASINA, P.—MUSILOVA, V. : 1/f Noise in GaAs Schottky Diodes, Physica Status Solidi A-Applied research 84 No. 2 (1984), 693–696.10.1002/pssa.2210840244
    Search in Google Scholar
  6. [6] JONES, B. K. : Electrical Noise as a Reliability Indicator in Electronic Device and Components, IEE Proceedings – Circuits Device and System 149 No. NSI (Feb 2002), 13–22.10.1049/ip-cds:20020331
    Search in Google Scholar
  7. [7] VANDAME, L. K. J. : Opportunities and Limitations to Use Low-Frequency Noise as a Diagnostic Tool for Device Quality, Proceedings of the 17th International Conference Noise and Fluctuations ICNF 2003, Prague, pp. 735–748.
    Search in Google Scholar
  8. [8] KOKTAVY, P.—VANEK, J.—CHOBOLA, Z. : Solar Cells Noise Diagnostic and LBIC Comparison, 19th International Conference on Noise and Fluctuations, AIP conference proceedings, vol. 922, Tokyo, Japan, 2007, pp. 306–309.10.1063/1.2759689
    Search in Google Scholar
  9. [9] BYCHIKHIN, S.—POGANY, D.—VANDAMME, L. K. J.—MENEGHESSO, G.—ZANONI, E. : Low-Frequency Noise Sources in As-Prepared and Aged GaN-based Light-Emitting Diodes, J. Appl. Phys 97 No. 12, Article Nr. 123714, 2005.
    Search in Google Scholar
  10. [10] KONCZAKOWSKA, A. : Lifetime Dependence on 1/f Noise of Bipolar Transistors, Proc. of Noise in Physical Systems (C. M. van Vliet, ed.), vol. 489, World Scientific, Singapore, 1987.
    Search in Google Scholar
  11. [11] CHOBOLA, Z. : Noise as a Tool for Non-Destructive Testing of Single-Crystal Silicon Solar-Cells, In Microelectronics Reliability, vol. 41, 2001, pp. 1947–1952.10.1016/S0026-2714(01)00219-0
    Search in Google Scholar
  12. [12] CHOBOLA, Z. : Noise as Characterization for GaSb Based Laser Diodes Prepared by Molecular Beam Epitaxy, Semiconductor Lasers and Laser Dynamics Iv, 7720, 2010.10.1117/12.854891
    Search in Google Scholar
  13. [13] CHOBOLA, Z. : Impulse Noise in Silicon Solar Cells, Microelectronics Journal 32/9 (2001), 707–711.10.1016/S0026-2692(01)00059-3
    Search in Google Scholar
DOI: https://doi.org/10.2478/jee-2015-0036 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632
Journal RSS Feed
Language: English
Page range: 226 - 230
Submitted on: Nov 13, 2014
|
Published on: Sep 19, 2015
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year
Keywords:
molecular beam epitaxy,
excess nois,
lasers diodes,
vertical cavity surface emitting,
gasb substrate
Related subjects:
Engineering,
Introductions and overviews,
Engineering, other

© 2015 Zdeněk Chobola, Miroslav Luňák, Jiří Vaněk, Eduard Hulicius, Ivo Kusák, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Previous articleVolume 66 (2015): Issue 4 (July 2015)Next article