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Low–Frequency Noise Measurements Used For Quality Assessment Of GaSb Based Laser Diodes Prepared By Molecular Beam Epitaxy Cover

Low–Frequency Noise Measurements Used For Quality Assessment Of GaSb Based Laser Diodes Prepared By Molecular Beam Epitaxy

Journal of Electrical Engineering
Volume 66 (2015): Issue 4 (July 2015)
By: ,  ,  ,   and    
Open Access
|Sep 2015
References

References

  1. [1] VAN DER ZIEL, A.—TONG, H. : Low Frequency Noise Predicts when a Transistor will Fail, ElectronicsNo. 24 (1966), 95–97.
    Search in Google Scholar
  2. [2] GUPTA, M. S. : Applications of Electrical Noise, Proceedings of IEEENo. 7 (July 1975), 996–1010.
    Open DOISearch in Google Scholar
  3. [3] DAI, Y. : Optimal Low-Frequency Noise Criteria used as a Reliability Test for BJTs and Experimental Results, Microelectronics ReliabilityNo. 1 (1991), 75–78.
    Open DOISearch in Google Scholar
  4. [4] CLAEYS, C.—SIMOEN, E. : Noise as Diagnostic Tool for Semiconductor Material and Device Characterization, Journal of the Electrochemical SocietyNo. 6 (June 1998), 2058–2067.
    Open DOISearch in Google Scholar
  5. [5] SIKULA, J.—VASINA, P.—MUSILOVA, V. : 1/f Noise in GaAs Schottky Diodes, Physica Status Solidi A-Applied researchNo. 2 (1984), 693–696.
    Open DOISearch in Google Scholar
  6. [6] JONES, B. K. : Electrical Noise as a Reliability Indicator in Electronic Device and Components, IEE Proceedings – Circuits Device and SystemNo. NSI (Feb 2002), 13–22.
    Open DOISearch in Google Scholar
  7. [7] VANDAME, L. K. J. : Opportunities and Limitations to Use Low-Frequency Noise as a Diagnostic Tool for Device Quality, Proceedings of the 17th International Conference Noise and Fluctuations ICNF 2003, Prague, pp. 735–748.
    Search in Google Scholar
  8. [8] KOKTAVY, P.—VANEK, J.—CHOBOLA, Z. : Solar Cells Noise Diagnostic and LBIC Comparison, 19th International Conference on Noise and Fluctuations, AIP conference proceedings, vol. 922, Tokyo, Japan, 2007, pp. 306–309.
    Open DOISearch in Google Scholar
  9. [9] BYCHIKHIN, S.—POGANY, D.—VANDAMME, L. K. J.—MENEGHESSO, G.—ZANONI, E. : Low-Frequency Noise Sources in As-Prepared and Aged GaN-based Light-Emitting Diodes, J. Appl. PhysNo. 12, Article Nr. 123714, 2005.
    Search in Google Scholar
  10. [10] KONCZAKOWSKA, A. : Lifetime Dependence on 1/f Noise of Bipolar Transistors, Proc. of Noise in Physical Systems (C. M. van Vliet, ed.), vol. 489, World Scientific, Singapore, 1987.
    Search in Google Scholar
  11. [11] CHOBOLA, Z. : Noise as a Tool for Non-Destructive Testing of Single-Crystal Silicon Solar-Cells, In Microelectronics Reliability, vol. 41, 2001, pp. 1947–1952.
    Open DOISearch in Google Scholar
  12. [12] CHOBOLA, Z. : Noise as Characterization for GaSb Based Laser Diodes Prepared by Molecular Beam Epitaxy, Semiconductor Lasers and Laser Dynamics Iv, 7720, 2010.
    Open DOISearch in Google Scholar
  13. [13] CHOBOLA, Z. : Impulse Noise in Silicon Solar Cells, Microelectronics Journal(2001), 707–711.
    Open DOISearch in Google Scholar
DOI: https://doi.org/10.2478/jee-2015-0036 | Journal eISSN: 1339-309X (formerly 1335-3632) | Journal ISSN: 1335-3632
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Language: English
Page range: 226 - 230
Submitted on: Nov 13, 2014
Published on: Sep 19, 2015
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Keywords:
molecular beam epitaxy,
excess nois,
lasers diodes,
vertical cavity surface emitting,
gasb substrate
Related subjects:
Engineering,
Introductions and overviews,
Engineering, other

© 2015 Zdeněk Chobola, Miroslav Luňák, Jiří Vaněk, Eduard Hulicius, Ivo Kusák, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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