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Low–Frequency Noise Measurements Used For Quality Assessment Of GaSb Based Laser Diodes Prepared By Molecular Beam Epitaxy Cover

Low–Frequency Noise Measurements Used For Quality Assessment Of GaSb Based Laser Diodes Prepared By Molecular Beam Epitaxy

Open Access
|Sep 2015

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DOI: https://doi.org/10.2478/jee-2015-0036 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632
Language: English
Page range: 226 - 230
Submitted on: Nov 13, 2014
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Published on: Sep 19, 2015
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year

© 2015 Zdeněk Chobola, Miroslav Luňák, Jiří Vaněk, Eduard Hulicius, Ivo Kusák, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.