Low–Frequency Noise Measurements Used For Quality Assessment Of GaSb Based Laser Diodes Prepared By Molecular Beam Epitaxy
Language: English
Page range: 226 - 230
Submitted on: Nov 13, 2014
|Published on: Sep 19, 2015
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year
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© 2015 Zdeněk Chobola, Miroslav Luňák, Jiří Vaněk, Eduard Hulicius, Ivo Kusák, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.