Comparative Study of Trace Metrics between Bibliometrics and Patentometrics
By: Fred Y. Ye, Mu-Hsuan Huang and Dar-Zen Chen
Language: English
Page range: 13 - 31
Submitted on: Feb 20, 2016
Accepted on: May 12, 2016
Published on: Sep 1, 2017
Published by: Chinese Academy of Sciences, National Science Library
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
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© 2017 Fred Y. Ye, Mu-Hsuan Huang, Dar-Zen Chen, published by Chinese Academy of Sciences, National Science Library
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.