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Plasma characterization of the gas-puff target source dedicated for soft X-ray microscopy using SiC detectors Cover

Plasma characterization of the gas-puff target source dedicated for soft X-ray microscopy using SiC detectors

Nukleonika
Volume 61 (2016): Issue 2 (June 2016)
By: Alfio Torrisi,  Przemysław Wachulak,  Lorenzo Torrisi,  Andrzej Bartnik,  Łukasz Węgrzyński and  Henryk Fiedorowicz  
Open Access
|Jun 2016

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DOI: https://doi.org/10.1515/nuka-2016-0024 | Journal eISSN: 1508-5791 | Journal ISSN: 0029-5922
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Language: English
Page range: 139 - 143
Submitted on: Sep 24, 2015
Accepted on: Dec 1, 2015
Published on: Jun 15, 2016
Published by: Institute of Nuclear Chemistry and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
gas-puff target,
plasma diagnostic technique,
SiC detector,
‘water-window’,
EUV
Related subjects:
Chemistry,
Nuclear chemistry,
Physics,
Astronomy and astrophysics,
Physics, other

© 2016 Alfio Torrisi, Przemysław Wachulak, Lorenzo Torrisi, Andrzej Bartnik, Łukasz Węgrzyński, Henryk Fiedorowicz, published by Institute of Nuclear Chemistry and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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