Plasma characterization of the gas-puff target source dedicated for soft X-ray microscopy using SiC detectors

Alfio Torrisi; Przemysław Wachulak; Lorenzo Torrisi; Andrzej Bartnik; Łukasz Węgrzyński; Henryk Fiedorowicz

doi:10.1515/nuka-2016-0024

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Plasma characterization of the gas-puff target source dedicated for soft X-ray microscopy using SiC detectors

Nukleonika

Volume 61 (2016): Issue 2 (June 2016)

By: Alfio Torrisi, Przemysław Wachulak, Lorenzo Torrisi, Andrzej Bartnik, Łukasz Węgrzyński and Henryk Fiedorowicz

Open Access

|Jun 2016

Abstract

An Nd:YAG pulsed laser was employed to irradiate a nitrogen gas-puff target. The interaction gives rise to the emission of soft X-ray (SXR) radiation in the ‘water window’ spectral range (λ= 2.3÷4.4 nm). This source was already successfully employed to perform the SXR microscopy. In this work, a Silicon Carbide (SiC) detector was used to characterize the nitrogen plasma emission in terms of gas-puff target parameters. The measurements show applicability of SiC detectors for SXR plasma characterization.

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Articles in this issue

DOI: https://doi.org/10.1515/nuka-2016-0024 | Journal eISSN: 1508-5791 | Journal ISSN: 0029-5922

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Language: English

Page range: 139 - 143

Submitted on: Sep 24, 2015

Accepted on: Dec 1, 2015

Published on: Jun 15, 2016

Published by: Institute of Nuclear Chemistry and Technology

In partnership with: Paradigm Publishing Services

Publication frequency: 4 issues per year

Keywords:

gas-puff target,

plasma diagnostic technique,

Related subjects:

Physics,

Astronomy and astrophysics,

Physics, other

© 2016 Alfio Torrisi, Przemysław Wachulak, Lorenzo Torrisi, Andrzej Bartnik, Łukasz Węgrzyński, Henryk Fiedorowicz, published by Institute of Nuclear Chemistry and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Volume 61 (2016): Issue 2 (June 2016)