Plasma characterization of the gas-puff target source dedicated for soft X-ray microscopy using SiC detectors
Language: English
Page range: 139 - 143
Submitted on: Sep 24, 2015
Accepted on: Dec 1, 2015
Published on: Jun 15, 2016
Published by: Institute of Nuclear Chemistry and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
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© 2016 Alfio Torrisi, Przemysław Wachulak, Lorenzo Torrisi, Andrzej Bartnik, Łukasz Węgrzyński, Henryk Fiedorowicz, published by Institute of Nuclear Chemistry and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.