Authors
Morteza Daneshmand
iCV Research Group, Institute of Technology, University of Tartu,, Tartu, Estonia
Egils Avots
iCV Research Group, Institute of Technology, University of Tartu,, Tartu, Estonia
Gholamreza Anbarjafari
iCV Research Group, Institute of Technology, University of Tartu,, Tartu, Estonia
Department of Electrical and Electronic Engineering, Hasan Kalyoncu University,, Gaziantep, Turkey