Authors
Igor Zakharov
Kharkiv National University of Radio Electronics, Department of Metrology and Technical Expertise, Faculty of Infocommunications, University, Nauky Ave., 14, 61166,, Kharkiv, Ukraine
Pavel Neyezhmakov
pavel.neyezhmakov@metrology.kharkov.ua
National Scientific Centre “Institute of Metrology”, Myronosytska Str., 42, 61002,, Kharkiv, Ukraine
Olesia Botsiura
Kharkiv National University of Radio Electronics, Department of Higher Mathematics, Faculty of Information-Analytical Technologies and Management, University, Nauky Ave., 14, 61166,, Kharkiv, Ukraine