Have a personal or library account? Click to login
The influence of Kanthal wire surface defects on the formation of Si nanolayer deposited by PVD method Cover

The influence of Kanthal wire surface defects on the formation of Si nanolayer deposited by PVD method

Materials Science-Poland
Volume 36 (2018): Issue 2 (June 2018)
By: Mieczysław Szczypiński,  Kazimierz Reszka and  Michał M. Szczypiński  
Open Access
|Jun 2018

Metrics

DOI: https://doi.org/10.1515/msp-2018-0038 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
Journal RSS Feed
Language: English
Page range: 264 - 269
Submitted on: Mar 18, 2017
|
Accepted on: Mar 15, 2018
|
Published on: Jun 25, 2018
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
PVD,
nanolayers,
microwire,
corrosion,
EPS
Related subjects:
Materials sciences,
Materials sciences, other,
Nanomaterials,
Functional and smart materials,
Materials characterization and properties

© 2018 Mieczysław Szczypiński, Kazimierz Reszka, Michał M. Szczypiński, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

Previous articleVolume 36 (2018): Issue 2 (June 2018)Next article