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The influence of Kanthal wire surface defects on the formation of Si nanolayer deposited by PVD method Cover

The influence of Kanthal wire surface defects on the formation of Si nanolayer deposited by PVD method

Materials Science-Poland
Volume 36 (2018): Issue 2 (June 2018)
By: Mieczysław Szczypiński,  Kazimierz Reszka and  Michał M. Szczypiński  
Open Access
|Jun 2018

Authors

Mieczysław Szczypiński

PPHU TERMEX sp. z o.o.,, Koszalin, Poland

Kazimierz Reszka

Koszalin University of Technology, 75-453, Koszalin, Poland

Michał M. Szczypiński

michal.szczypinski@tul.cz

Technical University of Liberec, 461 17, Liberec, Czech Republic
DOI: https://doi.org/10.1515/msp-2018-0038 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
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Language: English
Page range: 264 - 269
Submitted on: Mar 18, 2017
|
Accepted on: Mar 15, 2018
|
Published on: Jun 25, 2018
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
PVD,
nanolayers,
microwire,
corrosion,
EPS
Related subjects:
Materials sciences,
Materials sciences, other,
Nanomaterials,
Functional and smart materials,
Materials characterization and properties

© 2018 Mieczysław Szczypiński, Kazimierz Reszka, Michał M. Szczypiński, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

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