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Structural and optical characterization of annealed As30Te60Ga10 thin films prepared by thermal evaporation technique Cover

Structural and optical characterization of annealed As30Te60Ga10 thin films prepared by thermal evaporation technique

Materials Science-Poland
Volume 36 (2018): Issue 2 (June 2018)
By: ,  ,  ,  ,   and    
Open Access
|Jun 2018
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DOI: https://doi.org/10.1515/msp-2018-0022 | Journal eISSN: 2083-134X (formerly 2083-124X) | Journal ISSN: 2083-1331
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Language: English
Page range: 193 - 202
Submitted on: Dec 22, 2016
Accepted on: Feb 13, 2018
Published on: Jun 25, 2018
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Keywords:
chalcogenide,
As-Te-Ga,
thin films,
structural properties,
optical properties,
thermal evaporation
Related subjects:
Materials sciences,
Materials sciences, other,
Nanomaterials,
Functional and smart materials,
Materials characterization and properties

© 2018 A.M. Abd-Elnaiem, M. Mohamed, R.M. Hassan, M.A. Abdel-Rahim, A.A. Abu-Sehly, M.M. Hafiz, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

Volume 36 (2018): Issue 2 (June 2018)
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