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Structural and optical characterization of annealed As30Te60Ga10 thin films prepared by thermal evaporation technique Cover

Structural and optical characterization of annealed As30Te60Ga10 thin films prepared by thermal evaporation technique

Open Access
|Jun 2018

Authors

A.M. Abd-Elnaiem

abd-elnaiem@aun.edu.eg

Physics Department, Faculty of Science, Assiut University,, Assiut, Egypt

M. Mohamed

Physics Department, Faculty of Science, Assiut University, 71516, Assiut, Egypt

R.M. Hassan

Physics Department, Faculty of Science, Assiut University, 71516, Assiut, Egypt
Physics Department, Faculty of Education-Zingiber, Aden University,, Aden, Yemen

M.A. Abdel-Rahim

Physics Department, Faculty of Science, Assiut University, 71516, Assiut, Egypt

A.A. Abu-Sehly

Physics Department, Faculty of Science, Assiut University, 71516, Assiut, Egypt

M.M. Hafiz

Physics Department, Faculty of Science, Assiut University, 71516, Assiut, Egypt
DOI: https://doi.org/10.1515/msp-2018-0022 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
Language: English
Page range: 193 - 202
Submitted on: Dec 22, 2016
|
Accepted on: Feb 13, 2018
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Published on: Jun 25, 2018
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year

© 2018 A.M. Abd-Elnaiem, M. Mohamed, R.M. Hassan, M.A. Abdel-Rahim, A.A. Abu-Sehly, M.M. Hafiz, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.