Structural and optical characterization of annealed As30Te60Ga10 thin films prepared by thermal evaporation technique
Authors
A.M. Abd-Elnaiem
Physics Department, Faculty of Science, Assiut University,, Assiut, Egypt
M. Mohamed
Physics Department, Faculty of Science, Assiut University, 71516, Assiut, Egypt
R.M. Hassan
Physics Department, Faculty of Science, Assiut University, 71516, Assiut, Egypt
Physics Department, Faculty of Education-Zingiber, Aden University,, Aden, Yemen
M.A. Abdel-Rahim
Physics Department, Faculty of Science, Assiut University, 71516, Assiut, Egypt
A.A. Abu-Sehly
Physics Department, Faculty of Science, Assiut University, 71516, Assiut, Egypt
M.M. Hafiz
Physics Department, Faculty of Science, Assiut University, 71516, Assiut, Egypt
Language: English
Page range: 193 - 202
Submitted on: Dec 22, 2016
Accepted on: Feb 13, 2018
Published on: Jun 25, 2018
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
Related subjects:
© 2018 A.M. Abd-Elnaiem, M. Mohamed, R.M. Hassan, M.A. Abdel-Rahim, A.A. Abu-Sehly, M.M. Hafiz, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.