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Photovoltage Formation Across Si P-N Junction Exposed to Laser Radiation Cover

Abstract

Photovoltage formation across Si p-n junction exposed to laser radiation is experimentally investigated. Illumination of the junction with 1.06 μm wavelength laser radiation leads to formation of classical photovoltage Uphdue to intense electronhole pair generation. When the photon energy is lower than the semiconductor forbidden energy gap, the photovoltage U is found to consist of two components, U = Uf+ Uph. The first Uf is a fast one having polarity of thermoelectromotive force of hot carriers. The second Uphis classical photovoltage with polarity opposite to Uf. It is found that Ufis linearly dependent on laser intensity. The classical photovoltage is established to decrease with the rise of radiation wavelength due to decrease in two-photon absorption coefficient with wavelength. Predominance of each separate component in the formation of the net photovoltage depends on both laser wavelength and intensity

DOI: https://doi.org/10.1515/msp-2017-0106 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
Language: English
Page range: 337 - 340
Submitted on: Jul 14, 2017
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Accepted on: Dec 4, 2017
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Published on: Jun 25, 2018
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year

© 2018 Steponas Ašmontas, Jonas Gradauskas, Algirdas Sužiedélis, Aldis Šilénas, Edmundas Širmulis, Vitas Švedas, Viktoras Vaičikauskas, Vytautas Vaičiūnas, Ovidijus Ž Žalys, Vitaliy Kostylyov, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.