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Multifractal characterization of epitaxial silicon carbide on silicon Cover

Multifractal characterization of epitaxial silicon carbide on silicon

Materials Science-Poland
Volume 35 (2017): Issue 3 (October 2017)
By: Ştefan Ţălu,  Sebastian Stach,  Shikhgasan Ramazanov,  Dinara Sobola and  Guseyn Ramazanov  
Open Access
|Oct 2017
DOI: https://doi.org/10.1515/msp-2017-0049 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
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Language: English
Page range: 539 - 547
Submitted on: Oct 13, 2016
Accepted on: Mar 28, 2017
Published on: Oct 31, 2017
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
surface roughness,
multifractal analysis,
atomic force microscopy,
silicon carbide,
film growth
Related subjects:
Materials sciences,
Materials sciences, other,
Nanomaterials,
Functional and smart materials,
Materials characterization and properties

© 2017 Ştefan Ţălu, Sebastian Stach, Shikhgasan Ramazanov, Dinara Sobola, Guseyn Ramazanov, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

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