Multifractal characterization of epitaxial silicon carbide on silicon
DOI: https://doi.org/10.1515/msp-2017-0049 | Journal eISSN: 2083-134X (formerly 2083-124X) | Journal ISSN: 2083-1331
Language: English
Page range: 539 - 547
Submitted on: Oct 13, 2016
Accepted on: Mar 28, 2017
Published on: Oct 31, 2017
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
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© 2017 Ştefan Ţălu, Sebastian Stach, Shikhgasan Ramazanov, Dinara Sobola, Guseyn Ramazanov, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.