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Multifractal characterization of epitaxial silicon carbide on silicon Cover

Multifractal characterization of epitaxial silicon carbide on silicon

Open Access
|Oct 2017

Authors

Ştefan Ţălu

Technical University of Cluj-Napoca, Faculty of Mechanical Engineering, Department of AET, Discipline of Descriptive Geometry and Engineering Graphics, 103-105 B-dul Muncii St.,, Cluj-Napoca, Romania

Sebastian Stach

University of Silesia, Faculty of Computer Science and Materials Science, Institute of Informatics, Department of Biomedical Computer Systems, ul. B˛edzi´nska 39, 41-205, Sosnowiec, Poland

Shikhgasan Ramazanov

SICLAB Limited liability company, 367030 Makhachkala, M., Yaragskogo, Russian Federation
Dagestan State University, Faculty of Physics, 367015, Makhachkala, Russian Federation

Dinara Sobola

sobola@vutbr.cz

Brno University of Technology, Faculty of Electrical Engineering and Communication, Physics Department, Technická 8, 616 00, Brno, Czech Republic

Guseyn Ramazanov

Dagestan State University, Faculty of Physics, 367015, Makhachkala, Russian Federation
DOI: https://doi.org/10.1515/msp-2017-0049 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
Language: English
Page range: 539 - 547
Submitted on: Oct 13, 2016
Accepted on: Mar 28, 2017
Published on: Oct 31, 2017
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year

© 2017 Ştefan Ţălu, Sebastian Stach, Shikhgasan Ramazanov, Dinara Sobola, Guseyn Ramazanov, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.