References
- [1]Bräuer G., Szyszka B., Vergöhl M., Bandorf R., Vacuum, 84 (2010), 1354.
- [2]Helmersson U., Lattemann M., Bohlmark J., Ehiasarian A.P., Gudmundsson J.T., Thin Solid Films, 513 (2006), 1.
- [3]Musil J., Baroch P., Vlček J., Nam K.H., Han J.G., Thin Solid Films, 475 (2005), 208.
- [4]Kelly P.J., Arnell R.D., Vacuum, 56 (2000), 159.
- [5]Musil J., Baroch P., Vacuum, 87 (2013), 96.
- [6]Baghriche O., Ehiasarian A.P., Kusiak-Nejman E., Pulgarin C., Sanjines R., Morawski A.W., Kiwi J., J.Photoch.Photobiol.A, 227 (2012), 11.
- [7]Anders A., Surf.Coat.Technol., 205 (2011), S1.
- [8]Lin J., Sproul W.D., Moorej.J., Wu Z., Lee S., Chistyakov R., Abraham B., Struct.Funct.Biol.ThinFilms, 63 (2011), 48.
- [9]Gudmundsson J.T., Vacuum, 84 (2010), 1360.
- [10]Anders A., Surf.Coat.Technol., 204 (2010), 2864.
- [11]Kelly P.J., West G., Kok Y.N., Bradley J.W., Swindells I., Clarke G.C.B., Surf.Coat.Technol., 202 (2007), 952.
- [12]Anders A., Surf.Coat.Technol., 200 (2005), 1893.
- [13]Musil J., Kadlec S., Münz W.D., J.Vac.Sci.Tech-nol.A, 9 (1991), 1171.
- [14]Rogozin A., Vinnichenko M., Shevchenko N., Kolitsch A., Müller W., Thin Solid Films, 496 Uller(2006), 197.
- [15]Britun N., Han J.G., Thin Solid Films, 516 (2008), 6542.
- [16]Britun N., Gaillard M., Oh S.G., Han J.G., J.Phys.D.Appl.Phys., 40 (2007), 5098.
- [17]Belkind A., Zhu W., Lopez J., Becker K., Plasma Sources Sci.T., 15 (2006), S17.
- [18]Bradley J.W., B äcker H., Kelly P.J., Arnell R.D., Surf.Coat.Technol., 135 (2001), 221.
- [19]Langmuir I., Mott-Smith H.M., Phys.Rev., 28 (1926), 727.
- [20]Merlino R.L., Am. J. Phys. 75 (2007), 1078.
- [21]Chen F.F., Phys.Plasmas, 14 (2007), 094703.
- [22]Chen F.F., Phys.Plasmas, 8 (2001), 3029.
- [23]Chen F.F., Evans J.D., Arnush D., Phys.Plasmas, 9 (2002), 1449.
- [24]Tichy M., Kudrna P., Behnke J.F., Csambal C., Klagge S., J.Phys., 7 (1997), 397.
- [25]Window B., Savvides N., J.Vac.Sci.Technol.A,4 (1986), 196.
- [26]Samuell C.M., Blackwell B.D., Howard J., Corr C.S., Phys.Plasmas, 20 (2013), 034502.
- [27]Johnson J.D., Holmes A.J.T., Rev.Sci.Instrum., 61 (1990), 2628.
- [28]Spolaore M., Antoni V., Bagatin M., Buffa A., Cavazzana R., Desideri D., Martines E., Pomaro N., Serianni G., Tramontin L., Surf.Coat.Technol., 116 (1999), 1083.
- [29]Posadowski W.M., Thin Solid Films, 392 (2001), 201.
- [30]Brudnik A., Czapla A., Posadowski W., Vacuum, 82 (2008), 1124.
- [31]Straňäk V., HubičKa Z., AdáMek P., BlažEk J., TichÞ M.,ŠPatenka P., Hippler R., Wrehdes.,Surf.Coat.Technol.,201(2006),2512.
- [32]Liebig B., Braithwaite N., Kelly P.J., Chistyakov R., Abraham B., Bradley J.W., Surf.Coat.Technol., 205 (2011), S312.
- [33]Gudmundsson J.T., Alami J., Helmersson U., Appl.Phys.Lett., 78 (2001), 3427.
- [34]Wiatrowski A., Vacuum, 82 (2008), 1111.
- [35]Wiatrowski A., Posadowski W.M., Radzimski Z.J., J.Vac.Sci.Technol.A, 26 (2008) 1277.
- [36]Gencoa Ltd.: Www.Gencoa.Com/Balance_And_ Unbalance/ (2015).
- [37]Dora J., Polish Patent No. 313150, 1996.
- [38]Posadowski W.M., Wiatrowski A., Dora J., Radzimski Z.J., Thin Solid Films, 516 (2008), 4478.
- [39]Depla D., Buyle G., Haemers J., De Gryse R., Surf.Coat.Technol., 200 (2006), 4329.
- [40]Bradley J.W., B äcker H., Surf.Coat.Technol., 200 (2005), 616.
- [41]Bradley J.W., B äcker H., Kelly P.J., Arnell R.D., Surf.Coat.Technol., 142 (2001), 337.
- [42]Drache S., Stranak V., Herrendorf A., Cada M., Hubicka Z., Tichy M., Hippler R., Vacuum, 90 (2013), 176.
- [43]Poolcharuansin P., Bradley J.W., Plasma Sources Sci.T, 19 (2010), 025010.
- [44]Passoth E., Kudrna P., Csambal C., Behnke J.F., Tich Þ; M., Helbig V., J.Phys.D:Appl.Phys, 30 (1997), 1763.
- [45]Rossnagel S.M., J.Vac.Sci.Technol.A, 6 (1988), 1821.
- [46]Helmersson U., Lattemann M., Bohlmark J., Ehiasarian A.P., Gudmundsson J.T., Thin Solid Film, 513 (2006), 1.
- [47]Chen F.F., Lecture Notes on Langmuir Probe Diagnostics, IEEE-ICOPS meeting, Mini-Course on Plasma Di-agnostics, Jeju, Korea, June 2003, http://www.seas. ucla.edu/~ffchen/publications.htm (2015).