Have a personal or library account? Click to login
Structural and optical characteristics of SnS thin film prepared by SILAR Cover

Structural and optical characteristics of SnS thin film prepared by SILAR

Materials Science-Poland
Volume 33 (2015): Issue 4 (December 2015)
By: A. Mukherjee and  P. Mitra  
Open Access
|Jan 2016

References

  1. [1] Mariappan R., Ragavendar M., Ponnuswamy V., Opt. Appl., 41 (4) (2011), 989.
    Search in Google Scholar
  2. [2] Yue G.H., Wang W., Wang L.S., Wang X., Yan P.X., Chen Y., Peng D.L., J. Alloy. Compd., 474 (2009), 445.10.1016/j.jallcom.2008.06.105
    Search in Google Scholar
  3. [3] Guneri E., Gode F., Ulutas C., Kirmizigul F., Altindemir G., Gumus C., Chalcogenide Lett., 7 (2010), 685.
    Search in Google Scholar
  4. [4] Gao C., Sehn H., Sun L., Appl. Surf. Sci., 257 (2011), 6750.10.1016/j.apsusc.2011.02.116
    Search in Google Scholar
  5. [5] Sohila S., Rajalakshmi M., Ghosh C., J. Alloy. Compd., 509 (2011), 5843.10.1016/j.jallcom.2011.02.141
    Search in Google Scholar
  6. [6] Reddy K.T.R., Reddy N.K., Miles R.W., Sol. Energ. Mat. Sol. C, 90 (2006), 3041.10.1016/j.solmat.2006.06.012
    Search in Google Scholar
  7. [7] Loferski J.J., J. Appl. Phys., 27 (1956), 777.10.1063/1.1722483
    Search in Google Scholar
  8. [8] Prasert S., Jaeyeong H., Wontae N., Adam S.H., Roy G.G., http://nrs.harvard.edu/urn-3:HUL.InstRepos:5366599.
    Search in Google Scholar
  9. [9] Sankapal B.R., Mane R.S., Lokhande C.D., Mater. Res. Bull., 35 (2000), 2027.10.1016/S0025-5408(00)00405-0
    Search in Google Scholar
  10. [10] Nicolau Y.F., Dupuy M., Brunel M., J. Electrochem. Soc., 137 (1990), 2915.10.1149/1.2087099
    Search in Google Scholar
  11. [11] Lutterotti L., Matthies S., Wenk H.R., ICOTOM-12, 1 (1999), 1599.
    Search in Google Scholar
  12. [12] Rasband W.S., ImageJ, U.S. National Institutes of Health, Bethesda, Maryland, USA, http://imagej.nih.gov/ij/, 1997 – 2014.
    Search in Google Scholar
  13. [13] Tauc. J., Mater. Res. Bull., 5 (1970), 721.10.1016/0025-5408(70)90112-1
    Search in Google Scholar
  14. [14] Henry J., Mohanraj K., Kannan S., Barathan S., Sivakumar G., J. Exp. Nanosci., 8 (2013) 12.
    Search in Google Scholar
  15. [15] Khel L.K., Khan S., Zaman M.I., J. Chem. Soc. Pak., 27 (2005), 24.
    Search in Google Scholar
  16. [16] Kamalasanan M.N., Chandra S., Thin Solid Films, 288 (1966), 112.10.1016/S0040-6090(96)08864-5
    Search in Google Scholar
  17. [17] Pakdel A., Ghodsi F.E., Pramana-J. Phys., 76 (2011), 973.10.1007/s12043-011-0106-3
    Search in Google Scholar
  18. [18] Xu Y., Salim N.A., Tilley R.D., Nanomaterials-Basel, 2 (2012), 54.10.3390/nano2010054532788028348295
    Search in Google Scholar
  19. [19] Ghosh B., Das M., Banerjee P., Das S., Appl. Surf. Sci. 254 (2008), 6436.10.1016/j.apsusc.2008.04.008
    Search in Google Scholar
DOI: https://doi.org/10.1515/msp-2015-0118 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
Journal RSS Feed
Language: English
Page range: 847 - 851
Submitted on: Feb 24, 2015
Accepted on: Oct 8, 2015
Published on: Jan 6, 2016
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
SnS,
SILAR,
thin films,
FESEM,
FT-IR
Related subjects:
Materials sciences,
Materials sciences, other,
Nanomaterials,
Functional and smart materials,
Materials characterization and properties

© 2016 A. Mukherjee, P. Mitra, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Previous articleVolume 33 (2015): Issue 4 (December 2015)Next article