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Structural and optical characteristics of SnS thin film prepared by SILAR Cover

Structural and optical characteristics of SnS thin film prepared by SILAR

Materials Science-Poland
Volume 33 (2015): Issue 4 (December 2015)
By: A. Mukherjee and  P. Mitra  
Open Access
|Jan 2016

Authors

A. Mukherjee

ayanmukherjee88@gmail.com

Dept. of Physics, The University of Burdwan, India

P. Mitra

Dept. of Physics, The University of Burdwan, India
DOI: https://doi.org/10.1515/msp-2015-0118 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
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Language: English
Page range: 847 - 851
Submitted on: Feb 24, 2015
Accepted on: Oct 8, 2015
Published on: Jan 6, 2016
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
SnS,
SILAR,
thin films,
FESEM,
FT-IR
Related subjects:
Materials sciences,
Materials sciences, other,
Nanomaterials,
Functional and smart materials,
Materials characterization and properties

© 2016 A. Mukherjee, P. Mitra, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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