References
- [1] F
lores -Gonzalez M.A., Villanuevalbanez M., Diazde L.S.J.L., SMCSYV, 19 (2006), 23. - [2] X
u X.H., Jiang X.F., Li X.L., Chen Y., Gehring G. A., Appl. Surf. Sci., 258 (2008), 4956. - [3] A
sogwa P.U., Ezugwu S.C., Ezema F.I., Ekwealor A.B.C., Ezekoye B.A., Osuji R.U., J. Optoelectron. Adv. M., 11 (2009), 940. - [4] S
chroder D.K., Semiconductor Material and Device Characterization, John Wiley & Sons, New York, 2006. - [5] A
jayi E. O.B., M. Sc. Thesis, Urbana Illinois, 1970. - [6] M
izushima K., Jones P.C., Wiseman P.J., Goodenough J.B., Mater. Res. Bull., 15 (1980), 783. - [7] A
ntaya M., Dahn J.R., Preston J.S., Rossen E., Reimers J.N., J. Electrochem. Soc., 140 (1993), 475. - [8] W
ang B., Bates J.B., Hart F.X., Sales B.C., Zhur R.A., Robertson J.D., J. Electrochem. Soc., 143 (1996), 3203. - [9] E
leruja M.A., Adedeji A.V., Egharevba G.O., Lambi J.N., Akanni M.S., Jeynes C., Ajayi E. O.B., Opt. Mater., 20 (2002), 119. - [10] F
ischer J., Adelhelm C., Bergfeldt T., Chang K., Ziebert C., Leiste H., Stüber M., Ulrich S., Music D., Hallstedt B., Seifert H.J., Thin Solid Films, 10 (2012), 1016. - [11] A
run P., Vaishali P., Dong W.S., Ji -Won C., Dong -Soo P., Seok -Jin Y., Mater. Res. Bull., 43 (2007), 13. - [12] R
ex X., J. Met. (Jom-E), 49 (1997), 10. - [13] A
jayi O.B., Osuntola O.K., Ojo I.A.O., Jeynes C., Thin Solid Films, 248 (1994), 57. - [14] E
leruja M.A., Adedeji A.V., Ojo I.A.O., Djebah A., Osasona O., Aladekomo J.B., Ajayi E. O.B., Opt. Mater.,10 (1998), 257. - [15] C
hu W.K., Mayer J.W., Nicholet M.A., Backscattering Spectroscopy, Academic Press, London, 1978. - [16] M
alinsky P., Slepicka P., Hnatowicz V., Svorcik V., Nanoscale Res. Lett., 7 (1) (2012), 241. - [17] J
in S.W., Wadley H. N.G., J. Vac. Sci. Technol. A, 26 (2008), 1. - [18] T
hiagarajan S., Hsuan T.H., Chen S.-H., Int. J. Electrochem Sci., 6 (2011), 2235. - [19] M
oon H.-S., Ji K.-S., Park J.-W., J. Korean Phys. Soc., 40 (2002), 22. - [20] F
ranssila S., Thin-film Growth and Structure, in: Franssila S., Introduction to Microfabrication, John Wiley & Sons, Singapore, 2004, p. 77. - [21] S
trobe X.P., Vicat J., Qui D.T., J. Solid State Chem., 55 (1984), 67. - [22] V
icat J., Fanchon E., Strobel P., Qui D.T., Acta Crystallogr. B, 42 (1986), 162. - [23] S
trobel P., Charenton J.C., Mater. Res. Bull., 28 (1996), 93. - [24] A
ltaf M., Chaudhry M.A., J. Korean Phys. Soc., 36 (2000), 265. - [25] A
jenifuja E., Fasasi A.Y., Osinkolu G.A., T. Indian Ceram. Soc., 71 (2012), 181. - [26] T
auc J., Grigorovici R., Vancu A., Phys. Status Solidi, 15 (1966), 627. - [27] J
onscher A.K., Thin Solid Films, 1 (1967), 213.