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UV-Vis studies of 800 keV Ar ion irradiated NiO thin films Cover

UV-Vis studies of 800 keV Ar ion irradiated NiO thin films

Materials Science-Poland
Volume 33 (2015): Issue 3 (September 2015)
By: P. Mallick,  D.K. Mishra,  P. Kumar and  D. Kanjilal  
Open Access
|Aug 2016

References

  1. [1] ZHAI P., YI Q., JIAN J., WANG H., SONG P., DONG C., LU X., SUN Y., ZHAO J., DAI X., LOU Y., YANG H., ZOU G., Chem. Commun., 50 (2014), 1854.10.1039/c3cc48877b24402170
    Search in Google Scholar
  2. [2] AL-KAHLOUT A., PAWLICKA A., AEGERTER M., Sol. Energy Mater. Sol. C, 90 (2006), 3583.10.1016/j.solmat.2006.06.053
    Search in Google Scholar
  3. [3] LOU XC, ZHAO XJ, HE X, Sol. Energy, 83 (2009), 2103.10.1016/j.solener.2009.06.020
    Search in Google Scholar
  4. [4] IRWIN M.D., BUCHHOLZ D.B., HAINS A.W., CHANG R.P.H., MARKS T.J., Proc. Natl. Acad. Sci. USA, 105 (2008), 2783.10.1073/pnas.0711990105
    Search in Google Scholar
  5. [5] STEINEBACH H, KANNAN S, RIETH L, SOLZBACHER F, Sensor. Actuat. B-Chem., 151 (2010), 162.10.1016/j.snb.2010.09.027
    Search in Google Scholar
  6. [6] TSAI S.-Y., HON M.-H., LU Y.-M., Solid-State Electron., 63 (2011), 37.10.1016/j.sse.2011.04.019
    Search in Google Scholar
  7. [7] LEE Y.-M., YANG H.-W., HUANG C.-M, J. Phys. D Appl. Phys., 45 (2012), 225302.10.1088/0022-3727/45/22/225302
    Search in Google Scholar
  8. [8] MALLICK P., AGARWAL D.C., RATH CHANDANA, BISWAL R., BEHERA D., AVASTHI D.K., KANJILAL D., SATYAM P.V., MISHRA N.C., Nucl. Instrum. Meth. B, 266 (2008), 3332.10.1016/j.nimb.2008.04.013
    Search in Google Scholar
  9. [9] MALLICK P., RATH CHANDANA, PRAKASH JAI, MISHRA D.K., CHOUDHARY R.J., PHASE D.M., TRIPATHI A., AVASTHI D.K., KANJILAL D., MISHRA N.C., Nucl. Instrum. Meth. B, 268 (2010), 1613.10.1016/j.nimb.2010.02.005
    Search in Google Scholar
  10. [10] MALLICK P., DASH B.N., SOLANKI V., VARMA S., MISHRA N.C., Adv. Sci. Eng. Med., 6 (10) (2014), 1118.10.1166/asem.2014.1620
    Search in Google Scholar
  11. [11] REGUIG B.A., KHELIL A., CATTIN L., MORSLI M., BERNEDE J.C., Appl. Surf. Sci., 253 (2007), 4330.10.1016/j.apsusc.2006.09.046
    Search in Google Scholar
  12. [12] CHEN H.L., LU Y.M., HWANG W.S., Surf. Coat. Technol., 198 (2005), 138.10.1016/j.surfcoat.2004.10.032
    Search in Google Scholar
  13. [13] MOHANTY P., RATH CHANDANA, MALLICK P., BISWAL R., MISHRA N.C., Physica B, 405 (2010), 2711.10.1016/j.physb.2010.03.064
    Search in Google Scholar
  14. [14] AHMAD S., ASHRAF M., AHMAD A., SINGH D.V., Arab. J. Sci. Eng., 38 (2013), 1889.10.1007/s13369-013-0551-z
    Search in Google Scholar
  15. [15] MALLICK P., MISHRA D.K., KUMAR P., KANJILAL D., Indian J. Phys., 88 (7) (2014), 691.10.1007/s12648-014-0474-x
    Search in Google Scholar
  16. [16] KUMAR P., RODRIGUES G., RAO U.K., SAFVAN C.P., KANJILAL D., ROY A., Pramana, 59 (2002), 805.10.1007/s12043-002-0094-4
    Search in Google Scholar
  17. [17] MOTT N.F., DAVIES E.A., Electronic Processes in Non-Crystalline Materials, Clarendon Press, Oxford, 1979.
    Search in Google Scholar
  18. [18] BANERJEE A.N., CHATTOPADHYAY K.K., Reactive SputteredWide-Bandgap p-Type Semiconducting Spinel AB, in: DEPLA D., MAHEIU S. (Eds.), Reactive Sputter Deposition, Springer-Verlag, Berlin Heidelberg, 2008, p.413.10.1007/978-3-540-76664-3_12
    Search in Google Scholar
  19. [19] LI X, ZHANG X, LI Z, QIAN Y, Solid State Commun., 137 (2006), 581.10.1016/j.ssc.2006.01.031
    Search in Google Scholar
  20. [20] POWELL R.J., SPICER W.E., Phys. Rev. B, 2 (1970), 2182.10.1103/PhysRevB.2.2182
    Search in Google Scholar
  21. [21] KUIPER P., KRUIZINGA G., GHIJSEN J., SAWATZKY G.A., VERWEIJ H., Phys. Rev. Lett., 2 (1989), 221.10.1103/PhysRevLett.62.22110039954
    Search in Google Scholar
  22. [22] HUFNER S., STEINER P., REINERT F., SCHMITT H., SANDL P., Z. Phys. B, 88 (1992), 247.10.1007/BF01323579
    Search in Google Scholar
  23. [23] MACKRODT W.C., NOGUERA C., Surf. Sci., 457 (2000), L386.10.1016/S0039-6028(00)00405-2
    Search in Google Scholar
  24. [24] KUMAR V., SINGH J.K., Ind. J. Pure Appl. Phys., 48 (2010), 571.
    Search in Google Scholar
  25. [25] FREITAG A., STAEMMLER V., CAPPUS D., VENTRICE C.A., AL SHAMERY K., KUHLENBECK H., FREUND H.-J., Chem. Phys. Lett., 210 (1993), 10.10.1016/0009-2614(93)89091-U
    Search in Google Scholar
  26. [26] NEWMAN R., CHRENKO R.M., Phys. Rev., 114 (1959), 1507.10.1103/PhysRev.114.1507
    Search in Google Scholar
  27. [27] PROPACH V., REINEN D., DRENKHALN H., BUSCHBAUM H. MULLER, Z. Naturforsch., 33b (1978) 619.10.1515/znb-1978-0611
    Search in Google Scholar
  28. [28] COX P.A., WILLIAMS A.A., Surf. Sci., 152 (1985), 791.10.1016/0039-6028(85)90489-3
    Search in Google Scholar
  29. [29] FROMME B., SCHMITT M., KISKER E., GORSCHLU¨TER A., MERZ H., Phys. Rev. B, 50 (1994), 1874.10.1103/PhysRevB.50.1874
    Search in Google Scholar
  30. [30] GRAAF C. DE, BROER R., NIEUWPOORT W.C., Chem. Phys., 208 (1996), 35.10.1016/0301-0104(96)00083-3
    Search in Google Scholar
  31. [31] SATITKOVITCHAI K., PAVLYUKH Y., HÜBNER W., Phys. Rev. B, 67 (2003), 165413.10.1103/PhysRevB.67.165413
    Search in Google Scholar
  32. [32] GELEIJNS M., GRAAF C. DE, BROER R., NIEUWPOORT W.C., Surf. Sci., 421 (1999), 106.10.1016/S0039-6028(98)00835-8
    Search in Google Scholar
  33. [33] MACKRODT W.C., NOGUERA C., ALLAN N.L., Faraday Discuss., 114 (1999), 105.10.1039/a904185k
    Search in Google Scholar
  34. [34] FROMME B., MÖLLER M., ANSCHÜTZ TH., BETHKE C., KISKER E., Phys. Rev. Lett., 77 (1996), 1548.10.1103/PhysRevLett.77.154810063106
    Search in Google Scholar
  35. [35] XU C., OH W.S., GUO Q., GOODMAN D.W., J. Vac.Sci. Technol. A, 14 (1996), 1395.10.1116/1.579960
    Search in Google Scholar
  36. [36] GUO Q., XU C., GOODMAN D.W., Langmuir, 14 (1998), 1371. 10.1021/la9707235
    Search in Google Scholar
DOI: https://doi.org/10.1515/msp-2015-0082 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
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Language: English
Page range: 555 - 559
Submitted on: Nov 4, 2014
Accepted on: May 19, 2015
Published on: Aug 30, 2016
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
ion irradiation,
nanoparticles,
UV-Vis spectroscopy,
band gap
Related subjects:
Materials sciences,
Materials sciences, other,
Nanomaterials,
Functional and smart materials,
Materials characterization and properties

© 2016 P. Mallick, D.K. Mishra, P. Kumar, D. Kanjilal, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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