UV-Vis studies of 800 keV Ar ion irradiated NiO thin films
By: P. Mallick, D.K. Mishra, P. Kumar and D. Kanjilal
Language: English
Page range: 555 - 559
Submitted on: Nov 4, 2014
Accepted on: May 19, 2015
Published on: Aug 30, 2016
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
Related subjects:
© 2016 P. Mallick, D.K. Mishra, P. Kumar, D. Kanjilal, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.