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UV-Vis studies of 800 keV Ar ion irradiated NiO thin films Cover

UV-Vis studies of 800 keV Ar ion irradiated NiO thin films

Materials Science-Poland
Volume 33 (2015): Issue 3 (September 2015)
By: P. Mallick,  D.K. Mishra,  P. Kumar and  D. Kanjilal  
Open Access
|Aug 2016

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DOI: https://doi.org/10.1515/msp-2015-0082 | Journal eISSN: 2083-134X | Journal ISSN: 2083-1331
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Language: English
Page range: 555 - 559
Submitted on: Nov 4, 2014
Accepted on: May 19, 2015
Published on: Aug 30, 2016
Published by: Wroclaw University of Science and Technology
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
ion irradiation,
nanoparticles,
UV-Vis spectroscopy,
band gap
Related subjects:
Materials sciences,
Materials sciences, other,
Nanomaterials,
Functional and smart materials,
Materials characterization and properties

© 2016 P. Mallick, D.K. Mishra, P. Kumar, D. Kanjilal, published by Wroclaw University of Science and Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

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