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Study of Copper Nitride Thin Film Structure Cover

Study of Copper Nitride Thin Film Structure

Latvian Journal of Physics and Technical Sciences
Volume 53 (2016): Issue 2 (April 2016)
By: ,  ,  ,   and    
Open Access
|May 2016
References

References

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DOI: https://doi.org/10.1515/lpts-2016-0011 | Journal eISSN: 2255-8896 (formerly 0868-8257) | Journal ISSN: 0868-8257
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Language: English
Page range: 31 - 37
Published on: May 20, 2016
Published by: Institute of Physical Energetics
In partnership with: Paradigm Publishing Services
Keywords:
copper nitride,
thin film,
x-ray diffraction,
x-ray absorption spectroscopy
Related subjects:
Physics,
Technical and applied physics

© 2016 A. Kuzmin, A. Kalinko, A. Anspoks, J. Timoshenko, R. Kalendarev, published by Institute of Physical Energetics
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Volume 53 (2016): Issue 2 (April 2016)
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