Study of Copper Nitride Thin Film Structure
By: A. Kuzmin, A. Kalinko, A. Anspoks, J. Timoshenko and R. Kalendarev
References
- 1. Zachwieja, U., and Jacobs, H. (1990). Ammonothermalsynthese von kupfernitrid, Cu3N. J. Less Common Metals 161, 175–184. DOI: 10.1016/0022-5088(90)90327-G.
- 2. Paniconi, G., Stoeva, Z., Doberstein, H., Smith, R. I., Gallagher, B. L., and Gregory, D.H. (2007). Structural chemistry of Cu3N powders obtained by ammonolysis reactions. Solid State Sci. 9, 907–913. DOI: 10.1016/j.solidstatesciences.2007.03.017.
- 3. Asano, M., Umeda, K., and Tasaki, A. (1990). Cu3N thin film for a new light recording media. Jpn. J. Appl. Phys. 29, 1985–1986. DOI: 10.1143/JJAP.29.1985.
- 4. Maruyama, T., and Morishita, T. (1996). Copper nitride and tin nitride thin films for write-once optical recording media. Appl. Phys. Lett. 69, 890–891. DOI: 10.1063/1.117978.
- 5. Borsa, D.M., Grachev, S., Presura, C., and Boerma, D.O. (2002). Growth and properties of Cu3N films and Cu3N/γ’-Fe4N bilayers. Appl. Phys. Lett. 80, 1823–1825. DOI: 10.1063/1.1459116.
- 6. Wu, H., and Chen, W. (2011). Copper nitride nanocubes: size-controlled synthesis and application as cathode catalyst in alkaline fuel cells. J. Am. Chem. Soc. 133, 15236–15239. DOI: 10.1021/ja204748u.
- 7. Maya, L. (1993). Deposition of crystalline binary nitride films of tin, copper, and nickel by reactive sputtering. J. Vac. Sci. Technol. A 11, 604–608. DOI: 10.1116/1.578778.
- 8. Borsa, D.M., and Boerma, D.O. (2004). Growth, structural and optical properties of Cu3N films. Surf. Sci. 548, 95–105. DOI: 10.1016/j.susc.2003.10.053.
- 9. Zakutayev, A., Caskey, Ch.M., Fioretti, A.N., Ginley, D.S., Vidal, J., Stevanovic, V., Tea, E., and Lany, S. (2014). Defect tolerant semiconductors for solar energy conversion. J. Phys. Chem. Lett. 5, 1117–1125. DOI: 10.1021/jz5001787.
- 10. Caskey, Ch. M., Richards, R.M., Ginleya, D.S., and Zakutayev, A. (2014). Thin film synthesis and properties of copper nitride, a metastable semiconductor. Mater. Horiz. 1, 424–430. DOI: 10.1039/c4mh00049h.
- 11. Pierson, J.F. (2002). Structure and properties of copper nitride films formed by reactive magnetron sputtering. Vacuum 66, 59–64. DOI: 10.1016/S0042-207X(01)00425-0.
- 12. Maruyama, T., and Morishita, T. (1995). Copper nitride thin films prepared by radio-frequency reactive sputtering. J. Appl. Phys. 78, 4104–4107. DOI: 10.1063/1.359868.
- 13. Hahn, U., and Weber, W. (1996). Electronic structure and chemical-bonding mechanism of Cu3N, Cu3NPd, and related Cu(I) compounds. Phys. Rev. B 53, 12684. DOI: 10.1103/PhysRevB.53.12684.
- 14. Moreno-Armenta, M.G., Martínez-Ruiz, A., and Takeuchi, N. (2004). Ab initio total energy calculations of copper nitride: The effect of lattice parameters and Cu content in the electronic properties. Solid State Sci. 6, 9–14. DOI: 10.1016/j.solidstatesciences.2003.10.014.
- 15. Hou, Z.F. (2008). Effects of Cu, N, and Li intercalation on the structural stability and electronic structure of cubic Cu3N. Solid State Sci. 10, 1651–1657. DOI: 10.1016/j.solidstatesciences.2008.02.013.
- 16. Zhao, J.G., Yang, L.X., and Yu, Y., (2006). Pressure-induced metallization and structural evolution of Cu3N. Phys. Stat. Sol. (b) 243, 573–578. DOI: 10.1002/pssb.200541280.
- 17. Wosylus, A., Schwarz, U., Akselrud, L., Tucker, M.G., Hanfland, M., Rabia, K., Kuntscher, C., von Appen, J., Dronskowski, R., Rau, D., and Niewa, R. (2009). High-pressure phase transition and properties of Cu3N: An experimental and theoretical study. Z. Anorg. Allg. Chem. 635, 1959–1968. DOI: 10.1002/zaac.200900369.
- 18. Rickers, K., Drube, W., Schulte-Schrepping, H., Welter, E., Brüggmann, U., Herrmann, M., Heuer, J., and Schulz-Ritter, H. (2007). New XAFS Facility for In-Situ Measurements at Beamline C at HASYLAB. AIP Conf. Proc. 882, 905–907. DOI: 10.1063/1.2644700
- 19. Kuzmin, A. (1995). EDA: EXAFS data analysis software package. Physica B 208-209, 175–176. DOI: 10.1016/0921-4526(94)00663-G.
- 20. Aksenov, V.L., Kuzmin, A. Yu., Purans, J., and Tyutyunnikov, S.I. (2006). Development of Methods of EXAFS Spectroscopy on Synchrotron Radiation Beams: Review. Crystallogr. Rep. 51, 908–935. DOI: 10.1134/S1063774506060022.
- 21. Kuzmin, A., and Chaboy, J. (2014). EXAFS and XANES analysis of oxides at the nanoscale. IUCrJ 1, 571–589. DOI: 10.1107/S2052252514021101.
- 22. Ankudinov, A.L., Ravel, B., Rehr, J.J., and Conradson, S.D. (1998). Real-space multiple-scattering calculation and interpretation of x-ray-absorption near-edge structure. Phys. Rev. B 58, 7565–7576. DOI: 10.1103/PhysRevB.58.7565.
- 23. Rehr, J.J., and Albers, R.C. (2000). Theoretical approaches to x-ray absorption fine structure. Rev. Mod. Phys. 72, 621–654. DOI: 10.1103/RevModPhys.72.621.
- 24. Xiao, J., Li, Y., and Jiang, A. (2011). Structure, optical property and thermal stability of copper nitride films prepared by reactive radio frequency magnetron sputtering. J. Mater. Sci. Technol. 27, 403–407. DOI: 10.1016/S1005-0302(11)60082-0.
- 25. Yue, G.H., Yana, P.X., and Wang, J. (2005). Study on the preparation and properties of copper nitride thin films. J. Crystal Growth 274, 464–468. DOI: 10.1016/j.jcrysgro.2004.10.032.
- 26. Kuzmin, A., and Purans, J. (1993). A new fast spherical approximation for calculation of multiple scattering contribution in the X-ray absorption fine structure and its application to ReO3, NaWO3 and MoO3. J. Phys.: Condensed Matter 5, 267–282. DOI: 10.1088/0953-8984/5/3/004.
- 27. Anspoks, A., Kalinko, A., Kalendarev, R., and Kuzmin, A. (2012). Atomic structure relaxation in nanocrystalline NiO studied by EXAFS spectroscopy: Role of nickel vacancies. Phys. Rev. B 86, 174114, 1–11. DOI: 10.1103/PhysRevB.86.174114.
Language: English
Page range: 31 - 37
Published on: May 20, 2016
Published by: Institute of Physical Energetics
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year
Related subjects:
© 2016 A. Kuzmin, A. Kalinko, A. Anspoks, J. Timoshenko, R. Kalendarev, published by Institute of Physical Energetics
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.