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Scanning electron microscope fine tuning using four-bar piezoelectric actuated mechanism Cover

Scanning electron microscope fine tuning using four-bar piezoelectric actuated mechanism

Open Access
|Mar 2018

Abstract

Scanning Electron Microscopes are extensively used for accurate micro/nano images exploring. Several strategies have been proposed to fine tune those microscopes in the past few years. This work presents a new fine tuning strategy of a scanning electron microscope sample table using four bar piezoelectric actuated mechanisms. The introduced paper presents an algorithm to find all possible inverse kinematics solutions of the proposed mechanism. In addition, another algorithm is presented to search for the optimal inverse kinematic solution. Both algorithms are used simultaneously by means of a simulation study to fine tune a scanning electron microscope sample table through a pre-specified circular or linear path of motion. Results of the study shows that, proposed algorithms were able to minimize the power required to drive the piezoelectric actuated mechanism by a ratio of 97.5% for all simulated paths of motion when compared to general non-optimized solution.

DOI: https://doi.org/10.1515/jee-2018-0003 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632
Language: English
Page range: 24 - 31
Submitted on: Nov 15, 2017
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Published on: Mar 7, 2018
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year

© 2018 Khaled S. Hatamleh, Qais A. Khasawneh, Adnan Al-Ghasem, Mohammad A. Jaradat, Laith Sawaqed, Mohammad Al-Shabi, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.