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Scanning electron microscope fine tuning using four-bar piezoelectric actuated mechanism Cover

Scanning electron microscope fine tuning using four-bar piezoelectric actuated mechanism

Journal of Electrical Engineering
Volume 69 (2018): Issue 1 (January 2018)
By: Khaled S. Hatamleh,  Qais A. Khasawneh,  Adnan Al-Ghasem,  Mohammad A. Jaradat,  Laith Sawaqed and  Mohammad Al-Shabi  
Open Access
|Mar 2018

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DOI: https://doi.org/10.1515/jee-2018-0003 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632
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Language: English
Page range: 24 - 31
Submitted on: Nov 15, 2017
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Published on: Mar 7, 2018
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year
Keywords:
piezoelectric,
inverse kinematics optimization,
four-bar mechanism,
power minimization
Related subjects:
Engineering,
Introductions and overviews,
Engineering, other

© 2018 Khaled S. Hatamleh, Qais A. Khasawneh, Adnan Al-Ghasem, Mohammad A. Jaradat, Laith Sawaqed, Mohammad Al-Shabi, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

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