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Scanning electron microscope fine tuning using four-bar piezoelectric actuated mechanism Cover

Scanning electron microscope fine tuning using four-bar piezoelectric actuated mechanism

Open Access
|Mar 2018

Authors

Khaled S. Hatamleh

khatamleh@aus.edu

Mechanical Engineering Department, Jordan University of Science & Technology, Irbid, Jordan
Mechanical Engineering Department, American University of Sharjah, Sharjah

Qais A. Khasawneh

Mechanical Engineering Department, Jordan University of Science & Technology, Irbid, Jordan
Electromechanical Engineering Department, Institute of Applied Technology, Abu Dhabi

Adnan Al-Ghasem

Mechanical Engineering Department, Jordan University of Science & Technology, Irbid, Jordan
Mechanical engineering Department, Fahad bin Sultan University, Tabuk

Mohammad A. Jaradat

Mechanical Engineering Department, Jordan University of Science & Technology, Irbid, Jordan
Mechanical Engineering Department, American University of Sharjah, Sharjah

Laith Sawaqed

Mechanical Engineering Department, Jordan University of Science & Technology, Irbid, Jordan

Mohammad Al-Shabi

Mechanical Engineering Department, University of Sharjah, Sharjah
DOI: https://doi.org/10.1515/jee-2018-0003 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632
Language: English
Page range: 24 - 31
Submitted on: Nov 15, 2017
|
Published on: Mar 7, 2018
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year

© 2018 Khaled S. Hatamleh, Qais A. Khasawneh, Adnan Al-Ghasem, Mohammad A. Jaradat, Laith Sawaqed, Mohammad Al-Shabi, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.