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Morphology and FT IR spectra of porous silicon Cover

Morphology and FT IR spectra of porous silicon

Journal of Electrical Engineering
Volume 68 (2017): Issue 7 (December 2017)
By: Martin Kopani,  Milan Mikula,  Daniel Kosnac,  Jan Gregus and  Emil Pincik  
Open Access
|Dec 2017

Authors

Martin Kopani

martin.kopani@fmed.uniba.sk

Institute of Medical Physics, Biophysics, Informatics and Telemedicine, Faculty of Medicine, Comenius University, Bratislava, Slovakia

Milan Mikula

Faculty of Chemical and Food Technology of STU, Bratislava, Slovakia

Daniel Kosnac

Faculty of Mathematics, Physics, Informatics of Comenius University, Bratislava, Slovakia

Jan Gregus

Faculty of Mathematics, Physics, Informatics of Comenius University, Bratislava, Slovakia

Emil Pincik

Institute of Physics of SAS, Bratislava, Slovakia
DOI: https://doi.org/10.1515/jee-2017-0056 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632
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Language: English
Page range: 53 - 57
Submitted on: Apr 23, 2017
Published on: Dec 29, 2017
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year
Keywords:
porous silicon,
nanoparticles,
anodic etching,
morphology
Related subjects:
Engineering,
Introductions and overviews,
Engineering, other

© 2017 Martin Kopani, Milan Mikula, Daniel Kosnac, Jan Gregus, Emil Pincik, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

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