Investigation of deep defects in nanocrystalline-Si/Si interfaces using acoustic spectroscopy
By: Peter Bury, Štefan Hardoň, Hikaru Kobayashi and Kento Imamura
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DOI: https://doi.org/10.1515/jee-2017-0054 | Journal eISSN: 1339-309X (formerly 1335-3632) | Journal ISSN: 1335-3632
Language: English
Page range: 43 - 47
Submitted on: Apr 23, 2017
Published on: Dec 29, 2017
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
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© 2017 Peter Bury, Štefan Hardoň, Hikaru Kobayashi, Kento Imamura, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.