Investigation of deep defects in nanocrystalline-Si/Si interfaces using acoustic spectroscopy

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Open Access

|Dec 2017

Authors

Department of Physics, Faculty of Electrical Engineering, University of Žilina, Žilina, Slovakia

Department of Physics, Faculty of Electrical Engineering, University of Žilina, Žilina, Slovakia

Institute of Scientific and Industrial Research, Osaka University, CREST, Japan Science and Technology Organization, Osaka, Japan

Institute of Scientific and Industrial Research, Osaka University, CREST, Japan Science and Technology Organization, Osaka, Japan

DOI: https://doi.org/10.1515/jee-2017-0054 | Journal eISSN: 1339-309X | Journal ISSN: 1335-3632

Language: English

Page range: 43 - 47

Submitted on: Apr 23, 2017

Published on: Dec 29, 2017

Published by: Slovak University of Technology in Bratislava

In partnership with: Paradigm Publishing Services

Publication frequency: 6 issues per year

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© 2017 Peter Bury, Štefan Hardoň, Hikaru Kobayashi, Kento Imamura, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.