Investigation of deep defects in nanocrystalline-Si/Si interfaces using acoustic spectroscopy
By: Peter Bury, Štefan Hardoň, Hikaru Kobayashi and Kento Imamura
Authors
Peter Bury
Department of Physics, Faculty of Electrical Engineering, University of Žilina, Žilina, Slovakia
Štefan Hardoň
Department of Physics, Faculty of Electrical Engineering, University of Žilina, Žilina, Slovakia
Hikaru Kobayashi
Institute of Scientific and Industrial Research, Osaka University, CREST, Japan Science and Technology Organization, Osaka, Japan
Kento Imamura
Institute of Scientific and Industrial Research, Osaka University, CREST, Japan Science and Technology Organization, Osaka, Japan
Language: English
Page range: 43 - 47
Submitted on: Apr 23, 2017
Published on: Dec 29, 2017
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Publication frequency: 6 issues per year
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© 2017 Peter Bury, Štefan Hardoň, Hikaru Kobayashi, Kento Imamura, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.