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Patent Citations Analysis and Its Value in Research Evaluation: A Review and a New Approach to Map Technology-relevant Research Cover

Patent Citations Analysis and Its Value in Research Evaluation: A Review and a New Approach to Map Technology-relevant Research

Open Access
|Feb 2017

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DOI: https://doi.org/10.1515/jdis-2017-0002 | Journal eISSN: 2543-683X | Journal ISSN: 2096-157X
Language: English
Page range: 13 - 50
Submitted on: Nov 23, 2016
Accepted on: Dec 3, 2016
Published on: Feb 18, 2017
Published by: Chinese Academy of Sciences, National Science Library
In partnership with: Paradigm Publishing Services
Publication frequency: 4 times per year

© 2017 Anthony F.J. van Raan, published by Chinese Academy of Sciences, National Science Library
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.