Patent Citations Analysis and Its Value in Research Evaluation: A Review and a New Approach to Map Technology-relevant Research
Authors
Anthony F.J. van Raan
Centre for Science and Technology Studies (CWTS), Leiden University, Leiden, The Netherlands
Language: English
Page range: 13 - 50
Submitted on: Nov 23, 2016
Accepted on: Dec 3, 2016
Published on: Feb 18, 2017
Published by: Chinese Academy of Sciences, National Science Library
In partnership with: Paradigm Publishing Services
Publication frequency: 4 times per year
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© 2017 Anthony F.J. van Raan, published by Chinese Academy of Sciences, National Science Library
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.