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A Simple Approach to Designing and Implementing a Fault Detection Device for Large Quantities of Led Boards Cover

A Simple Approach to Designing and Implementing a Fault Detection Device for Large Quantities of Led Boards

By: Van Anh Pham and  Minh Tien Do  
Open Access
|Mar 2026

Figures & Tables

Figure 1.

A module of 3-LED (SMD 2583-164)

Figure 2.

X-ray image of the electrical circuit of the LED board

Figure 3.

X-ray image showing a defect in the LED chip

Figure 4.

Lateral X-ray image showing a defect on the LED chip

Figure 5.

X-ray image of the side view of the defective and functional LEDs

Figure 6.

Demonstration of manual resistance measurements for functional and defective LEDs

Figure 7.

Block schematic of control system

Figure 8.

Concept model of mechanical structure

Figure 9.

Schematic diagram of control center

Figure 10.

Schematics of the optically isolated relay module

Figure 11.

Connection diagram of peripheral devices (74HC165 and LFD module)

Figure 12.

Fault detection circuit of an LED

Figure 13.

(a) Schematics of a 3-LED module (SMD 2583-164), (b) the DC equivalent circuit of an LED

Figure 14.

Schematics of control flowchart

Figure 15.

Illustration of the measurement of current and voltage parameters on 1-Led model: SMD 2583-426 REV B (a), 3LED board model: SMD 2583-164 PCB REV B (b), and fault classification module (c)

Figure 16.

LED fault tester during assembly and testing

Figure 17.

Display screen of parameters

Figure 18.

Testing board samples (2583-164-PCB-REV B, 2583-426-REV B)

Figure 19.

Illustration of the device testing process with a small number of faulty LED boards

Figure 20.

A report sample of the testing result

Sample of faulty LED boards (2583-164-PCB-REV B)_

N.o. BoardNCR1NCR2NCR3NCR4NCR5
LED1Ledl StateONNNN
O pin10000
S pin00000
LED2Led2 StateNNSOS
O pin00010
S pin00101
LED3Led3 StateNONNN
O pin01000
S pin00000
DOI: https://doi.org/10.14313/jamris-2026-009 | Journal eISSN: 2080-2145 | Journal ISSN: 1897-8649
Language: English
Page range: 85 - 92
Submitted on: Apr 6, 2025
|
Accepted on: May 13, 2025
|
Published on: Mar 31, 2026
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year

© 2026 Van Anh Pham, Minh Tien Do, published by Łukasiewicz Research Network – Industrial Research Institute for Automation and Measurements PIAP
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.