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Fabrication and characterization of Si/SiO2/TiO2/ZnO heterostructures from sputtered and oxidized Ti-film
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Structural Characterization of Doped Thick Gainnas Layers - Ambiguities and Challenges
Damian Pucicki, Katarzyna Bielak, Beata Ściana, Wojciech Dawidowski, Karolina Żelazna, Jarosław Serafińczuk, Jaroslav Kováč, Andrej Vincze, Łukasz Gelczuk, Piotr Dłużewski