Security Problems of Scan Design and Accompanying Measures
Biasizzo, Anton, Novak, Franc
Measuring Static Parameters of Embedded ADC Core
Novak, Franc, Mrak, Peter, Biasizzo, Anton
On Measurement Uncertainty of ADC Nonlinearities in Oscillation-Based Test
Mrak, Peter, Biasizzo, Anton, Novak, Franc
A Multi–Alphabet Arithmetic Coding Hardware Implementation for Small FPGA Devices
Biasizzo, Anton, Novak, Franc, Korošec, Peter