Authors
Alexander Barkalov
Institute of Metrology, Electronics and Computer Science, University of Zielona Góra, Zielona Góra, Poland
Larysa Titarenko
Institute of Metrology, Electronics and Computer Science, University of Zielona Góra, Zielona Góra, Poland
Małgorzata Mazurkiewicz
m.mazurkiewicz@issi.uz.zgora.pl
Institute of Control and Computation Engineering, University of Zielona Góra, Zielona Góra, Poland