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Measuring Static Parameters of Embedded ADC Core Cover

Measuring Static Parameters of Embedded ADC Core

Journal of Electrical Engineering
Volume 62 (2011): Issue 2 (March 2011)
By: ,   and    
Open Access
|Jun 2011
Authors

Authors

Franc Novak

Peter Mrak

Anton Biasizzo

DOI: https://doi.org/10.2478/v10187-011-0013-3 | Journal eISSN: 1339-309X (formerly 1335-3632) | Journal ISSN: 1335-3632
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Language: English
Page range: 80 - 86
Published on: Jun 7, 2011
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Keywords:
ADC static parameters,
histogram based test,
built-in self-test,
system-on-chip
Related subjects:
Engineering,
Introductions and overviews,
Engineering, other

© 2011 Franc Novak, Peter Mrak, Anton Biasizzo, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons License.

Volume 62 (2011): Issue 2 (March 2011)
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