Skip to main content
Have a personal or library account? Click to login
Switching Magnetization Magnetic Force Microscopy — An Alternative to Conventional Lift-Mode MFM Cover

Switching Magnetization Magnetic Force Microscopy — An Alternative to Conventional Lift-Mode MFM

Journal of Electrical Engineering
Volume 62 (2011): Issue 1 (January 2011)
By: ,  ,  ,  ,  ,   and    
Open Access
|Jun 2011
References

References

  1. CAMBEL, V.—ELIÁŠ, P.—GREGUŠOVÁ, D.—MARTAUS, J.—FEDOR, J.—KARAPETROV, G.—NOVOSAD, V.: Magnetic Elements for Switching Magnetization Magnetic Force Microscopy Tips, J. Magnetism Magn. Mater.(2010), 2715-2721.
    Open DOISearch in Google Scholar
  2. MARTIN, Y.—WICKRAMASINGHE, H. K.: Magnetic Imaging by Force Microscopy" with 1000Å Resolution, Appl. Phys. Lett.(1987), 1455-1457.
    Open DOISearch in Google Scholar
  3. SÁENZ, J. J.—GARCÍA, N.—GRÜTTER, P.—MEYER, E.—HEINZELMANN, H.—WIESENDANGER, R.—ROSENTHALER, L.—HIDBER, H. R.—GÜNTHERODT, H.-J.: Observation of magnetic forces by the atomic force microscope, J. Appl. Phys.(1987), 4293-4295.
    Open DOISearch in Google Scholar
  4. RUGAR, D.—MAMIN, H. J.—GUETHNER, P.—LAMBERT, S. E.—STERN, J. E.—MCFAYDEN, I.—YOGI, T.: Magnetic Force Microscopy: General Principles and Application to Longitudinal Recording Media, J. Appl. Phys.(1990), 1169.
    Open DOISearch in Google Scholar
  5. ABELMANN, L.—PORTHUN, S.—HAAST, M.—LODDER, C.—MOSER, A.—BEST, M. E.—van SCHENDEL, P. J. A.—STIEFEL, B.—HUG, H. J.—HEYDON, G. P.—FARLEY, A.—HOON, S. R.—PFAFFELHUBER, T.—PROKSCH, R.—BABCOCK, K.: Comparing the Resolution of Magnetic Force Microscopes using the CAMST Reference Samples, J. Magn. Magn. Mater.(1998), 135-147.
    Open DOISearch in Google Scholar
  6. PU, A.—THOMSON, D. J.: Sub-Micron Resolution Magnetic Force Microscopy Mapping of Current Paths with Large Probe-to-Sample Separation, Meas. Sci. Technol.(2007), L19-L22.
    Open DOISearch in Google Scholar
  7. ALBRECHT, T. R.—GRÜTTER, P.—HORNE, D.—RUGAR, D.: Frequency Modulation Detection using High-Q Cantilevers for Enhanced Force Microscope Sensitivity, J. Appl. Phys.(1991), 668-673.
    Open DOISearch in Google Scholar
  8. BABCOCK, K. L.—ELINGS, V. B.—GURLEY, A.—KJOLLER, K.: Method and Apparatus For Obtaining Improved Vertical Metrology Measurements, US Patent No. 5,898,106, Digital Instruments, Santa Barbara, CA (1999).
    Search in Google Scholar
  9. GUARISCO, D.—NGUY, H.: High Linear Density in Perpendicular Recording, J. Appl. Phys.(2003), 6745-6747.
    Open DOISearch in Google Scholar
  10. MARTIN, J. I.—NOGUES, J.—LIU, K.—VICENT, J. L.—SCHULLER, I. K.: Ordered Magnetic Nanostructures: Fabrication and Properties, J. Magn. Magn. Mater.(2003), 449-501.
    Open DOISearch in Google Scholar
  11. GEERPURAM, D. N.—MANI, A. S.—BASKARAN, V. S.: A Novel Magnetic Random Access Memory Design using Square Ring Elements for the Hard Layer, J. Electron. Mater.(2004), 1269-1273.
    Open DOISearch in Google Scholar
  12. WOOD, R.: The Feasibility of Magnetic Recording at 1 Terabit per Square, IEEE Trans. Magn.(2000), 36-42.
    Open DOISearch in Google Scholar
  13. GRÜTTER, P.—WADAS, A.—MEYER, E.—HEINZELMANN, H.—HIDBER, H.-R.—GRÜNTERODT, H.-J.: High Resolution Magnetic Force Microscopy, J. Vac. Sci. Technol.(1990), 406-409.
    Open DOISearch in Google Scholar
  14. MAMIN, H. J.—RUGAR, D.—STERN, J. E.—FONTANA, R. E.—KASIRAJ, P.: Magnetic Force Microscopy of Thin Permalloy Films, Appl. Phys. Lett.(1989), 318-320.
    Open DOISearch in Google Scholar
  15. ENGEL-HERBERT, R.—SCHAADT, D. M.—HESJEDAL, T.: Analytical and Numerical Calculations of the Magnetic Force Microscopy Response: A Comparison, J. Appl. Phys.(2006), 113905.
    Open DOISearch in Google Scholar
  16. STREBLECHENKO, D. G.—SCHEINFEIN, M. R.—MANKOS, M.—BABCOCK, K.: Quantitative Magnetometry using Electron Holography: Field Profiles Near Magnetic Force Microscope Tips, IEEE Trans. Magn.(1996), 4124-4129.
    Open DOISearch in Google Scholar
  17. SCOTT, J.—MCVITIE, S.—FERRIER, R. P.—GALLAGHER, A.: Electrostatic Charging Artefacts in Lorentz Electron Tomography of MFM Tip Stray Fields, J. Phys. D(2001), 1326-1332.
    Open DOISearch in Google Scholar
  18. THIAVILLE, A.—BELLIARD, L.—MAJER, D.—ZELDOV, E.—MILTAT, J.: Measurement of the Stray Field Emanating from Magnetic Force Microscope Tips by Hall Effect Microsensors, J. Appl. Phys.(1997), 3182-3191.
    Open DOISearch in Google Scholar
  19. YOSHIDA, N.—YASUTAKE, M.—ARIE, T.—AKITA, S.—NAKAYAMA, Y.: Quantitative Analysis of the Magnetic Properties of Metal-Capped Carbon Nanotube Probe, Jpn. J. Appl. Phys.(2002), 5013-5016.
    Open DOISearch in Google Scholar
  20. KURAMOCHI, H.—MANAGO, T.—KOLTSOV, D.—TAKENAKA, M.—IITAKE, M.—AKINAGA, H.: Advantages of CNTMFM Probes in Observation of Domain Walls of Soft Magnetic Materials, Surf. Science(2007), 5289-529.
    Open DOISearch in Google Scholar
  21. KOBLISHKA, M. R.—HARTMANN, U.—SULZBACH, T.: — Improvements of the Lateral Resolution of the MFM Technique, Thin Solid Films(2003), 93-97.
    Open DOISearch in Google Scholar
  22. KOBLISHKA, M. R.—HARTMANN, U.—SULZBACH, T.: Resolving Magnetic Nanostructures in the 10-nm Range using MFM at Ambient Conditions, Mat. Sci. Engin.(2003), 747-751.
    Open DOISearch in Google Scholar
  23. HUANG, H. S.—LIN, M.W.—SUN, Y. C.—LIN, L. J.: Improving the Spatial Resolution of a Magnetic Force Microscope Tip via Focused Ion Beam Modification and Magnetic Film Coating, Scr. Mat.(2007), 365-368.
    Open DOISearch in Google Scholar
  24. FOLKS, L.—BEST, M. E.—RICE, P. M.—TERRIS, B. D.—WELLER, D.: Perforated Tips for High-Resolution In-Plane Magnetic Force Microscopy, Appl. Phys. Lett.(2000), 909-911.
    Open DOISearch in Google Scholar
  25. WOLNY, F.—WEISSKER, U.—MÜHL, T.—LEONHARDT, A.—MENZEL, S.—WINKLER, A.—BÜCHNER, B.: Iron-Filled Carbon Nanotubes as Probes for Magnetic Force Microscopy, J. Appl. Phys.(2008), 064908.
    Open DOISearch in Google Scholar
  26. KIRTLEY, J. R.—DENG, Z.—LUAN, L.—YENILMEZ, E.—DAI, H.—MOLER, K. A.: Moment Switching in Nanotube Magnetic Force Probes, Nanotechnology(2007), 465506.
    Open DOISearch in Google Scholar
  27. CAMBEL, V.—KARAPETROV, G.—BELKIN, A.—NOVOSAD, V.—ELIÁŠ, P.—GREGUŠOVÁ, D.—FEDOR, J.—KOSTIČ, I.—KÚDELA, R.—ŠOLT YS, J.: Switching Magnetization MFM - Novel Approach to Magnetic Field Imaging, In: Book of abstracts, ISPM (International Scanning Probe Microscopy Conference), Seattle, Washington, USA, June 22-24, (2008).
    Search in Google Scholar
  28. CAMBEL, V.—GREGUŠOVÁ, D.—KÚDELA, R.: Formation of GaAs Three-Dimensional Objects using AlAs "Facet-Forming" Sacrificial Layer and HPO, HO, HO based solution, J. Applied Physics(2003), 4643-4648.
    Open DOISearch in Google Scholar
  29. ŠOLTÝS, J.—GREGUŠOVÁ, D.—KÚDELA, R.—KUČERA, M.—KOSTIČ, I.—ZAHORAN, M.—CAMBEL, V.: Technology of "Active" Tips for Magnetic and Electric Force Microscopy, In: Book of abstracts, ISPM (International Scanning Probe Microscopy Conference), Seattle, Washington, USA, June 22-24, (2008).
    Search in Google Scholar
  30. GREGUŠOVÁ, D.—ELI AŠ, P.—ÖSZI, Z.—KÚDELA, R.— ŠOLTÝ S, J.—FEDOR, J.—CAMBEL, V.—KOSTIČ, I.: Technology and Properties of a Vector Hall Sensor, Microelectronics J.(2006), 1543-1546.
    Open DOISearch in Google Scholar
  31. GARCÍA, J. M.—THIAVILLE, A.—MILTAT, J.—KIRK, K. J.—CHAPMAN, J. N.: MFM Imaging of Patterned Permalloy Elements under an External Applied Field, J. Mag. Mag. Mat.(2002), 1267-1269.
    Open DOISearch in Google Scholar
  32. SCHNEIDER, M.—HOFFMANN, H.—ZWECK, J.: Magnetisation Reversal of Thin Submicron Elliptical Permalloy Elements, J. Mag. Mag. Mat.(2003), 1-10.
    Open DOISearch in Google Scholar
  33. ZHU, X.—GRÜTTER, P.—METLUSHKO, V.—HAO, Y.—CASTANO, F. J.—ROSS, A.—ILIC, B.—SMITH, H. I.: Construction of Hysteresis Loops of Single Domain Elements and Coupled Permalloy Ring Arrays by Magnetic Force Microscopy, J. Appl. Phys.(2003), 8540-8542.
    Open DOISearch in Google Scholar
  34. ZHU, X.—GRÜTTER, P.—METLUSHKO, V.—ILIC, B.: Magnetic Force Microscopy Study of ElectronBeam-Patterned Soft Permalloy Particles: Technique and Magnetization Behavior, Phys. Rev.(2002), 024423.
    Open DOISearch in Google Scholar
  35. BRYAN, M. T.—ATKINSON, D.—COWBURN, R. P.: Experimental Study of the Influence of Edge Roughness on Magnetization Switching in Permalloy Nanostructures, Appl. Phys. Lett.(2004), 3510-3512.
    Open DOISearch in Google Scholar
  36. CHANG, C. C.-CHANG, Y. C.—CHUNG, W. S.—WU, J. C.—WIE, Z. H.—LAI, M. F.—CHANG, C. R.: Influences of the Aspect Ratio and Film Thickness on Switching Properties of Elliptical Permalloy Elements, IEEE Trans. on Magnetics(2005), 947-949.
    Open DOISearch in Google Scholar
  38. IMRE, A.—CSABA, G.—JI, L.—ORLOV, A.—BERNSTEIN, G. H.—POROD, W.: Majority Logic Gate for Magnetic Quantum-Dot Cellular Automata, Science(2006), 205-207.
    Open DOISearch in Google Scholar
DOI: https://doi.org/10.2478/v10187-011-0006-2 | Journal eISSN: 1339-309X (formerly 1335-3632) | Journal ISSN: 1335-3632
Journal RSS Feed
Language: English
Page range: 37 - 43
Published on: Jun 7, 2011
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Keywords:
magnetic force microscopy,
micromagnetic calculations,
switching field
Related subjects:
Engineering,
Introductions and overviews,
Engineering, other

© 2011 Vladimír Cambel, Dagmar Gregušová, Peter Eliáš, Ján Fedor, Ivan Kostič, Ján Maňka, Peter Ballo, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons License.

Volume 62 (2011): Issue 1 (January 2011)
Previous article
Next article