Switching Magnetization Magnetic Force Microscopy — An Alternative to Conventional Lift-Mode MFM
Abstract
In the paper we present an overview of the latest progress in the conventional lift-mode magnetic force microscopy (MFM) technique, achieved by advanced MFM tips and by lowering the lift height. Although smaller lift height offers improved spatial resolution, we show that lowered tip-sample distance mixes magnetic, atomic and electric forces. We describe an alternative to the lift-mode procedure - Switching Magnetization Magnetic Force Microscopy [SM-MFM], which is based on two-pass scanning in tapping mode AFM with reversed tip magnetization between the scans. We propose design and calculate the magnetic properties of such SM-MFM tips. For best performance the tips must exhibit low magnetic moment, low switching field, and single-domain state at remanence. The switching field of such tips is calculated for Permalloy hexagons.
© 2011 Vladimír Cambel, Dagmar Gregušová, Peter Eliáš, Ján Fedor, Ivan Kostič, Ján Maňka, Peter Ballo, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons License.