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Contribution to the Quantitative Analysis of Ternary Alloys of Group III-Nitrides by Auger Spectroscopy Cover

Contribution to the Quantitative Analysis of Ternary Alloys of Group III-Nitrides by Auger Spectroscopy

Journal of Electrical Engineering
Volume 61 (2010): Issue 1 (January 2010)
By: ,  ,  ,   and    
Open Access
|Jun 2011
References

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DOI: https://doi.org/10.2478/v10187-010-0009-4 | Journal eISSN: 1339-309X (formerly 1335-3632) | Journal ISSN: 1335-3632
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Language: English
Page range: 62 - 64
Published online: Jun 7, 2011
Published in print: Jan 1, 2010
Published by: Slovak University of Technology in Bratislava
In partnership with: Paradigm Publishing Services
Keywords:
GaN,
AlN,
AlxGa1-xN,
AES relative elemental sensitivity factors,
component sputtering yields YGa/YAl
Related subjects:
Engineering,
Introductions and overviews,
Engineering, other

© 2011 Jozef Liday, Gernod Ecke, Tim Baumann, Peter Vogrinčič, Juraj Breza, published by Slovak University of Technology in Bratislava
This work is licensed under the Creative Commons License.

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