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Analysis of multibackground memory testing techniques Cover

Analysis of multibackground memory testing techniques

International Journal of Applied Mathematics and Computer Science
Volume 20 (2010): Issue 1 (March 2010)
By: Ireneusz Mrozek  
Open Access
|Mar 2010

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DOI: https://doi.org/10.2478/v10006-010-0014-6 | Journal eISSN: 2083-8492 | Journal ISSN: 1641-876X
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Language: English
Page range: 191 - 205
Published on: Mar 25, 2010
Published by: University of Zielona Góra
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
Keywords:
RAM testing,
pattern sensitive faults,
March tests,
multibackground testing
Related subjects:
Mathematics,
Applied mathematics

© 2010 Ireneusz Mrozek, published by University of Zielona Góra
This work is licensed under the Creative Commons License.

Volume 20 (2010): Issue 1 (March 2010)