Local Correlation and Entropy Maps as Tools for Detecting Defects in Industrial Images
Open Access
|Mar 2008References
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Language: English
Page range: 41 - 47
Published on: Mar 21, 2008
Published by: University of Zielona Góra
In partnership with: Paradigm Publishing Services
Publication frequency: 4 issues per year
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© 2008 Ewa Skubalska-Rafajłowicz, published by University of Zielona Góra
This work is licensed under the Creative Commons License.